LECTURE
- Field Effect Transistors
6. Field Effect Transistors
- Junctions
5. Junctions
- Excess Carriers in Semiconductors
4. Excess Carriers in Semiconductors
PUBLICATIONS
- C.H. Lee, S.W. Kim, H.C. Lee; Plasma-induced optimization of electron trapping for high-k charge trap memories: Mechanistic insights and modeling approaches, Ceramics International, 52 (2026) 26771
- C.H. Lee, S.W. Kim, H.C. Lee; Plasma-induced optimization of electron trapping for high-k charge trap memories: Mechanistic insights and modeling approaches, Ceramics International, 52 (2026) 26771
- H.H. Jeon, S.W. Kim, J.H. Choi, J.S. Hwang, H.C. Lee; Plasma etching of TiN and W electrodes with high etch selectivity over HZO thin films, Current Applied Physics, 83 (2026) 107
- H.H. Jeon, S.W. Kim, J.H. Choi, J.S. Hwang, H.C. Lee; Plasma etching of TiN and W electrodes with high etch selectivity over HZO thin films, Current Applied Physics, 83 (2026) 107
- H.J.Kim, J.H.Choi, S.E.Lee, S.W.Kim, H.C.Lee; Fabrication and Characterization of Ferroelectric Capacitors with a Symmetric Hybrid TiN/W/HZO/W/TiN Electrode Structure, Materials. 18 (2025) 3547
- H.J.Kim, J.H.Choi, S.E.Lee, S.W.Kim, H.C.Lee; Fabrication and Characterization of Ferroelectric Capacitors with a Symmetric Hybrid TiN/W/HZO/W/TiN Electrode Structure, Materials. 18 (2025) 3547






